https://www.mdu.se/

mdu.sePublications
Change search
Refine search result
1 - 4 of 4
CiteExportLink to result list
Permanent link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Rows per page
  • 5
  • 10
  • 20
  • 50
  • 100
  • 250
Sort
  • Standard (Relevance)
  • Author A-Ö
  • Author Ö-A
  • Title A-Ö
  • Title Ö-A
  • Publication type A-Ö
  • Publication type Ö-A
  • Issued (Oldest first)
  • Issued (Newest first)
  • Created (Oldest first)
  • Created (Newest first)
  • Last updated (Oldest first)
  • Last updated (Newest first)
  • Disputation date (earliest first)
  • Disputation date (latest first)
  • Standard (Relevance)
  • Author A-Ö
  • Author Ö-A
  • Title A-Ö
  • Title Ö-A
  • Publication type A-Ö
  • Publication type Ö-A
  • Issued (Oldest first)
  • Issued (Newest first)
  • Created (Oldest first)
  • Created (Newest first)
  • Last updated (Oldest first)
  • Last updated (Newest first)
  • Disputation date (earliest first)
  • Disputation date (latest first)
Select
The maximal number of hits you can export is 250. When you want to export more records please use the Create feeds function.
  • 1.
    Strandberg, Per
    et al.
    Westermo Research and Development, Sweden.
    Afzal, Wasif
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Ostrand, Thomas J.
    Weyuker, Elaine
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Sundmark, Daniel
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Automated System Level Regression Test Prioritization in a Nutshell2017In: IEEE Software, ISSN 0740-7459, E-ISSN 1937-4194, Vol. 34, no 4, p. 30-37, article id 7974685Article in journal (Refereed)
    Abstract [en]

    Westermo Research and Development has developed SuiteBuilder, an automated tool to determine an effective ordering of regression test cases. The ordering is based on factors such as fault detection success, the interval since the last execution, and code modifications. SuiteBuilder has enabled Westermo to overcome numerous regression-testing problems, including lack of time to run a complete regression suite, failure to detect bugs in a timely manner, and repeatedly omitted tests. In the tool's first two years of use, reordered test suites finished in the available time, most fault-detecting test cases were located in the first third of suites, no important test case was omitted, and the necessity for manual work on the suites decreased greatly. 

  • 2.
    Strandberg, Per Erik
    et al.
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. Westermo Network Technologies AB, Västerås, Sweden.
    Ostrand, Thomas J.
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Weyuker, Elaine
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. University of Central Florida, Orlando, USA.
    Afzal, Wasif
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Sundmark, Daniel
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Intermittently Failing Tests in the Embedded Systems Domain2020In: International Symposium on Software Testing and Analysis ISSTA'20, 2020, p. 337-348Conference paper (Refereed)
    Abstract [en]

    Software testing is sometimes plagued with intermittently failing tests and finding the root causes of such failing tests is often difficult. This problem has been widely studied at the unit testing level for open source software, but there has been far less investigation at the system test level, particularly the testing of industrial embedded systems. This paper describes our investigation of the root causes of intermittently failing tests in the embedded systems domain, with the goal of better understanding, explaining and categorizing the underlying faults. The subject of our investigation is a currently-running industrial embedded system, along with the system level testing that was performed. We devised and used a novel metric for classifying test cases as intermittent. From more than a half million test verdicts, we identified intermittently and consistently failing tests, and identified their root causes using multiple sources. We found that about 1-3% of all test cases were intermittently failing. From analysis of the case study results and related work, we identified nine factors associated with test case intermittence. We found that a fix for a consistently failing test typically removed a larger number of failures detected by other tests than a fix for an intermittent test. We also found that more effort was usually needed to identify fixes for intermittent tests than for consistent tests. An overlap between root causes leading to intermittent and consistent tests was identified. Many root causes of intermittence are the same in industrial embedded systems and open source software. However, when comparing unit testing to system level testing, especially for embedded systems, we observed that the test environment itself is often the cause of intermittence.

  • 3.
    Strandberg, Per Erik
    et al.
    Westermo RandD AB, Sweden.
    Ostrand, Thomas J.
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Weyuker, Elaine
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Sundmark, Daniel
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Afzal, Wasif
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Automated test mapping and coverage for network topologies2018In: ISSTA 2018 - Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, Association for Computing Machinery, Inc , 2018, p. 73-83Conference paper (Refereed)
    Abstract [en]

    Communication devices such as routers and switches play a critical role in the reliable functioning of embedded system networks. Dozens of such devices may be part of an embedded system network, and they need to be tested in conjunction with various computational elements on actual hardware, in many different configurations that are representative of actual operating networks. An individual physical network topology can be used as the basis for a test system that can execute many test cases, by identifying the part of the physical network topology that corresponds to the configuration required by each individual test case. Given a set of available test systems and a large number of test cases, the problem is to determine for each test case, which of the test systems are suitable for executing the test case, and to provide the mapping that associates the test case elements (the logical network topology) with the appropriate elements of the test system (the physical network topology). We studied a real industrial environment where this problem was originally handled by a simple software procedure that was very slow in many cases, and also failed to provide thorough coverage of each network's elements. In this paper, we represent both the test systems and the test cases as graphs, and develop a new prototype algorithm that a) determines whether or not a test case can be mapped to a subgraph of the test system, b) rapidly finds mappings that do exist, and c) exercises diverse sets of network nodes when multiple mappings exist for the test case. The prototype has been implemented and applied to over 10,000 combinations of test cases and test systems, and reduced the computation time by a factor of more than 80 from the original procedure. In addition, relative to a meaningful measure of network topology coverage, the mappings achieved an increased level of thoroughness in exercising the elements of each test system.

  • 4.
    Weyuker, Elaine
    et al.
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. University of Central Florida, Orlando, FL, United States.
    Ostrand, Thomas J.
    Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.
    Experiences with academic-industrial collaboration on empirical studies of software systems2017In: 2017 IEEE 28TH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING WORKSHOPS (ISSREW 2017), Institute of Electrical and Electronics Engineers Inc. , 2017, p. 164-168Conference paper (Refereed)
    Abstract [en]

    The authors have held both academic and industrial research positions, and have designed and carried out many empirical studies of large software systems that were built and maintained in industrial environments. Their experiences show that the most crucial component of a successful study is the participation of at least one industrial collaborator who is committed to the study’s goals and is able to provide advice and assistance throughout the course of the study. This paper describes studies carried out in three different industrial environments, discusses obstacles that arise, and how the authors have been able to overcome some of those obstacles. 

1 - 4 of 4
CiteExportLink to result list
Permanent link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf