mdh.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Robustness Testing of Embedded Software Systems: An Industrial Interview Study
Swedish ICT AB, Kista, Sweden .
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. Swedish ICT AB, Kista, Sweden .ORCID iD: 0000-0002-5032-2310
University of Skövde, Skövde, Sweden.
University of Skövde, Skövde, Sweden.
2016 (English)In: IEEE Access, E-ISSN 2169-3536, Vol. 4, 1859-1871 p., 7438745Article in journal (Refereed) Published
Resource type
Text
Abstract [en]

Embedded software is at the core of current and future telecommunication, automotive, multimedia, and industrial automation systems. The success of practically any industrial application depends on the embedded software system's dependability, and one method to verify the dependability of a system is testing its robustness. The motivation behind this paper is to provide a knowledge base of the state of the practice in robustness testing of embedded software systems and to compare this to the state of the art. We have gathered the information on the state of the practice in robustness testing from seven different industrial domains (telecommunication, automotive, multimedia, critical infrastructure, aerospace, consumer products, and banking) by conducting 13 semi-structured interviews. We investigate the different aspects of robustness testing, such as the general view of robustness, relation to requirements engineering and design, test execution, failures, and tools. We highlight knowledge from the state of the practice of robustness testing of embedded software systems. We found different robustness testing practices that have not been previously described. This paper shows that the state of the practice, when it comes to robustness testing, differs between organizations and is quite different from the state of the art described in the scientific literature. For example, methods commonly described in the literature (e.g., the fuzzy approach) are not used in the organizations we studied. Instead, the interviewees described several ad hoc approaches that take specific scenarios into account (e.g., power failure or overload). Other differences we found concern the classification of robustness failures, the hypothesized root causes of robustness failures, and the types of tools used for robustness testing. This paper is a first step in capturing the state of the practice of robustness testing of embedded software systems. The results can be used by both researchers and practitioners. Researchers can use our findings to understand the gap between the state of the art and the state of the practice and develop their studies to fill this gap. Practitioners can also learn from this knowledge base regarding how they can improve their practice and acquire other practices. 

Place, publisher, year, edition, pages
2016. Vol. 4, 1859-1871 p., 7438745
Keyword [en]
embedded systems, interviews, robustness, state of the art, state of the practice, survey, Testing, Application programs, Automation, Computer software, Consumer products, Embedded software, Knowledge based systems, Robustness (control systems), Surveying, Embedded software systems, Industrial automation system, Robustness testing, Scientific literature, Semi structured interviews, Software testing
National Category
Embedded Systems
Identifiers
URN: urn:nbn:se:mdh:diva-32538DOI: 10.1109/ACCESS.2016.2544951Scopus ID: 2-s2.0-84979823446OAI: oai:DiVA.org:mdh-32538DiVA: diva2:953607
Available from: 2016-08-18 Created: 2016-08-18 Last updated: 2016-08-18Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Sundmark, Daniel
By organisation
Embedded Systems
In the same journal
IEEE Access
Embedded Systems

Search outside of DiVA

GoogleGoogle Scholar

Altmetric score

Total: 8 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf