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Progress in Automated Software Defect Prediction
AT and T Labs - Research, USA.
AT and T Labs - Research, USA.ORCID iD: 0000-0002-1660-199X
2008 (English)In: Lecture Notes in Computer Science, v. 5394, 2008, 200-204 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2008. 200-204 p.
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-23696DOI: 10.1007/978-3-642-01702-5_20Scopus ID: 2-s2.0-67650320778ISBN: 9783642017018 (print)OAI: oai:DiVA.org:mdh-23696DiVA: diva2:680335
Conference
4th International Haifa Verification Conference, HVC 2008; Haifa; Israel; 27 October 2008 through 30 October 2008
Available from: 2013-12-17 Created: 2013-12-17 Last updated: 2017-03-06Bibliographically approved

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Weyuker, Elaine
Computer Systems

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Total: 86 hits
CiteExportLink to record
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Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
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Language
  • de-DE
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