https://www.mdu.se/

mdu.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Progress in Automated Software Defect Prediction
AT and T Labs - Research, USA.
AT and T Labs - Research, USA.ORCID iD: 0000-0002-1660-199X
2008 (English)In: Lecture Notes in Computer Science, v. 5394, 2008, p. 200-204Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2008. p. 200-204
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-23696DOI: 10.1007/978-3-642-01702-5_20Scopus ID: 2-s2.0-67650320778ISBN: 9783642017018 (print)OAI: oai:DiVA.org:mdh-23696DiVA, id: diva2:680335
Conference
4th International Haifa Verification Conference, HVC 2008; Haifa; Israel; 27 October 2008 through 30 October 2008
Available from: 2013-12-17 Created: 2013-12-17 Last updated: 2017-03-06Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Weyuker, Elaine

Search in DiVA

By author/editor
Weyuker, Elaine
Computer Systems

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 93 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf