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The Automated Generation of Test Cases using an Extended Domain Based Reliability Model
Siemens Corporate Research, USA.
AT and T Labs - Research, USA.ORCID iD: 0000-0002-1660-199X
2009 (English)In: Proceedings of the 2009 ICSE Workshop on Automation of Software Test, AST 2009, 2009, p. 44-52, article id 5069040Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2009. p. 44-52, article id 5069040
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Computer Systems
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URN: urn:nbn:se:mdh:diva-23693DOI: 10.1109/IWAST.2009.5069040Scopus ID: 2-s2.0-70349685410ISBN: 9781424437436 (print)OAI: oai:DiVA.org:mdh-23693DiVA, id: diva2:680328
Conference
2009 ICSE Workshop on Automation of Software Test, AST 2009; Vancouver, BC; Canada; 16 May 2009 through 24 May 2009
Available from: 2013-12-17 Created: 2013-12-17 Last updated: 2017-03-06Bibliographically approved

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Weyuker, Elaine

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