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Device Utilization Analysis for IEC 61499 Systems in Early Stages of Development
Mälardalen University, School of Innovation, Design and Engineering. (IS (Embedded Systems))ORCID iD: 0000-0003-4035-8763
Mälardalen University, School of Innovation, Design and Engineering. (IS (Embedded Systems))ORCID iD: 0000-0002-8461-0230
ABB Corporate Research Västerås, Sweden. (IS (Embedded Systems))ORCID iD: 0000-0002-3375-6766
2013 (English)In: IEEE International Conference on Emerging Technologies and Factory Automation, IEEE , 2013, p. Article number 6647970-Conference paper, Published paper (Refereed)
Abstract [en]

Model-driven and component-based approaches, such as the IEC~61499 standard, allow us to apply analysis to systems in early stages of development. When applied to embedded systems, early analysis can help guide the development process of both the software and the hardware platform, and thus reduce the time and cost of the development. In this paper we present a method for early analysis of device utilization for IEC~61499 systems. The method is based on determining device-specific worst-case execution time of each activity in the application. For this, we use timing information for individual algorithms together with IEC~61499 software and platform models. We provide a prototype implementation integrated in an open-source development environment.

Place, publisher, year, edition, pages
IEEE , 2013. p. Article number 6647970-
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:mdh:diva-22260DOI: 10.1109/ETFA.2013.6647970Scopus ID: 2-s2.0-84890631756ISBN: 9781479908622 (print)OAI: oai:DiVA.org:mdh-22260DiVA, id: diva2:661386
Conference
2013 IEEE 18th Conference on Emerging Technologies & Factory Automation (ETFA), 10-13 Sept., Cagliari, Italy
Projects
ASSIST - Analysis and Synthesis of Industrial Software SystemsRALF3 - Software for Embedded High Performance ArchitecturesAvailable from: 2013-11-03 Created: 2013-10-31 Last updated: 2014-01-10Bibliographically approved

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Lednicki, LukaCarlson, JanSandström, Kristian

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CiteExportLink to record
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