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Predicting software test effort in iterative development using a dynamic bayesian network
Blekinge Institute of Technology.
Blekinge Institute of Technology.
Blekinge Institute of Technology.
Blekinge Institute of Technology. (IS (Embedded Systems))ORCID iD: 0000-0003-0611-2655
2010 (English)In: International Symposium on Software Reliability Engineering, San Jose, CA, United States, 2010Conference paper, Published paper (Refereed)
Abstract [en]

Projects following iterative software development methodologies must still be managed in a way as to maximize quality and minimize costs. However, there are indications that predicting test effort in iterative development is challenging and currently there seem to be no models for test effort prediction. This paper introduces and validates a dynamic Bayesian network for predicting test effort in iterative software development. The proposed model is validated by the use of data from two industrial projects. The accuracy of the results has been veri?ed through different prediction accuracy measurements and statistical tests. The results from the validation con?rm that the model has the ability to predict test effort in iterative projects accurately.

Place, publisher, year, edition, pages
San Jose, CA, United States, 2010.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:mdh:diva-22285OAI: oai:DiVA.org:mdh-22285DiVA: diva2:661158
Conference
21st International Symposium on Software Reliability Engineering, San Jose, CA, USA,01 Nov - 04 Nov 2010
Projects
Project_External
Available from: 2013-11-01 Created: 2013-10-31 Last updated: 2013-12-03Bibliographically approved

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Afzal, Wasif
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CiteExportLink to record
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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
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Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf