https://www.mdu.se/

mdu.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
A Trace-Based Statistical Worst-Case Execution Time Analysis of Component-Based Real-Time Embedded Systems
Mälardalen University, School of Innovation, Design and Engineering.ORCID iD: 0000-0002-7366-7186
Mälardalen University, School of Innovation, Design and Engineering.ORCID iD: 0000-0001-6132-7945
University of York.ORCID iD: 0000-0003-2415-8219
INRIA Nancy-Grand Est, Nancy, France.
2011 (English)In: 2011 IEEE 16TH CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION (ETFA) / [ed] Mammeri, Z., New York: IEEE , 2011Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes the tool support for a framework for performing statistical WCET analysis of real-time embedded systems by using bootstrapping sampling and Extreme Value Theory (EVT). To be specific, bootstrapping sampling is used to generate timing traces, which not only fulfill the requirements given by statistics and probability theory, but also are robust to use in the context of estimating the WCET of programs. Next, our proposed statistical inference uses EVT to analyze such timing traces, and computes a WCET estimate of the target program, pertaining to a given predictable probability. The evaluation results show that our proposed method could have the potential of being able to provide a tighter upper bound on the WCET estimate of the programs under analysis, when compared to the estimates given by the referenced WCET analysis methods.

Place, publisher, year, edition, pages
New York: IEEE , 2011.
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:mdh:diva-13624DOI: 10.1109/ETFA.2011.6059190ISI: 000297542900208Scopus ID: 2-s2.0-80655141683ISBN: 978-1-4577-0018-7 (print)OAI: oai:DiVA.org:mdh-13624DiVA, id: diva2:466167
Conference
16th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Location: Toulouse, FRANCE Date: SEP 05-09, 2011
Available from: 2011-12-15 Created: 2011-12-15 Last updated: 2018-01-12Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Lu, YueNolte, ThomasBate, Iain

Search in DiVA

By author/editor
Lu, YueNolte, ThomasBate, Iain
By organisation
School of Innovation, Design and Engineering
Computer and Information Sciences

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 76 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf