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In Industrial Embedded Software, are Some Compilation Errors Easier to Localize and Fix than Others?
Ericsson Ab, Stockholm, Sweden; KTH Royal Institute of Technology, Stockholm, Sweden.
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. Ericsson Ab, Stockholm, Sweden.ORCID iD: 0000-0002-5070-9312
Ericsson Ab, Stockholm, Sweden.
Ericsson Ab, Stockholm, Sweden; KTH Royal Institute of Technology, Stockholm, Sweden.
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2024 (English)In: Proceedings - 2024 IEEE Conference on Software Testing, Verification and Validation, ICST 2024, Institute of Electrical and Electronics Engineers (IEEE), 2024, p. 383-394Conference paper, Published paper (Refereed)
Abstract [en]

Industrial embedded systems often require special-ized hardware. However, software engineers have access to such domain-specific hardware only at the continuous integration (CI) stage and have to use simulated hardware otherwise. This results in a higher proportion of compilation errors at the CI stage than in other types of systems, warranting a deeper study. To this end, we create a CI diagnostics solution called 'Shadow Job' that analyzes our industrial CI system. We collected over 40000 builds from 4 projects from the product source code and categorized the compilation errors into 14 error types, showing that the five most common ones comprise 89 % of all compilation errors. Additionally, we analyze the resolution time, size, and distance for each error type, to see if different types of compilation errors are easier to localize or repair than others. Our results show that the resolution time, size, and distance are independent of each other. Our research also provides insights into the human effort required to fix the most common industrial compilation errors. We also identify the most promising directions for future research on fault localization.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2024. p. 383-394
Keywords [en]
compilation error, continuous integration, fault localization, software build, Coding errors, Continuous integrations, Domain specific, Embedded-system, Error types, Integration systems, Resolution time, Specific hardware, Embedded software
National Category
Software Engineering
Identifiers
URN: urn:nbn:se:mdh:diva-68533DOI: 10.1109/ICST60714.2024.00042ISI: 001307930000034Scopus ID: 2-s2.0-85203842024ISBN: 9798350308181 (print)OAI: oai:DiVA.org:mdh-68533DiVA, id: diva2:1901354
Conference
17th IEEE Conference on Software Testing, Verification and Validation, ICST 2024, Toronto, Canada, 27-31 May, 2024
Available from: 2024-09-27 Created: 2024-09-27 Last updated: 2024-10-30Bibliographically approved

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Eldh, Sigrid

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