AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN AcceleratorsShow others and affiliations
2024 (English)In: Proceedings of the European Test Workshop, Institute of Electrical and Electronics Engineers (IEEE), 2024Conference paper, Published paper (Refereed)
Abstract [en]
Multiplication is the most resource-hungry operation in the neural network's processing elements. In this paper, we propose an architecture of a novel adaptive fault-tolerant approximate multiplier tailored for ASIC-based DNN accelerators. AdAM employs an adaptive adder relying on an unconventional use of the leading one position value of the inputs for fault detection through the optimization of unutilized adder resources. The proposed architecture uses a lightweight fault mitigation technique that sets the detected faulty bits to zero. The hardware resource utilization and the DNN accelerator's reliability metrics are used to compare the proposed solution against the triple modular redundancy (TMR) in multiplication, unprotected exact multiplication, and unprotected approximate multiplication. It is demonstrated that the proposed architecture enables a multiplication with a reliability level close to the multipliers protected by TMR utilizing 63.54% less area and having 39.06% lower power-delay product compared to the exact multiplier.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2024.
Keywords [en]
approximate computing, circuits design, deep neural networks, reliability, resiliency assessment, Convolution, Fault detection, Fault tolerance, Fault tolerant computer systems, Network architecture, Redundancy, Timing circuits, Adaptive fault tolerant, Circuit designs, Faults detection, Network-processing elements, Neural-network processing, Position value, Proposed architectures, Triple modular redundancy, Adders
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-68072DOI: 10.1109/ETS61313.2024.10567161ISI: 001260970400008Scopus ID: 2-s2.0-85197518684ISBN: 9798350349320 (print)OAI: oai:DiVA.org:mdh-68072DiVA, id: diva2:1884551
Conference
29th IEEE European Test Symposium, ETS 2024, The Hague, Netherlands, 20-24 May 2024
2024-07-172024-07-172024-08-28Bibliographically approved