SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN AcceleratorsShow others and affiliations
2024 (English)In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS), Institute of Electrical and Electronics Engineers Inc. , 2024, p. 19-24Conference paper, Published paper (Refereed)
Abstract [en]
Systolic array has emerged as a prominent archi-tecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essen-tial for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a well-established practical and robust method for reliability assessment, it is still a very time-consuming process. This paper addresses the time efficiency issue by introducing a novel hierarchical software-based hardware-aware fault injection strategy tailored for systolic array-based DNN accelerators. The uniform Recurrent Equations system is used for software modeling of the systolic-array core of the DNN accelerators. The approach demonstrates a reduction of the fault injection time up to 3 × compared to the state-of-the-art hybrid (software/hardware) hardware-aware fault injection frameworks and more than 2000 × compared to RT-level fault injection frameworks - without compromising accuracy. Additionally, we propose and evaluate a new reliability metric through experimental assessment. The performance of the framework is studied on state-of-the-art DNN benchmarks.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2024. p. 19-24
Keywords [en]
deep neural networks, fault simulation, hardware accelerator, reliability, resilience assessment, systolic array, Benchmarking, Reliability analysis, Safety engineering, Software testing, Systolic arrays, Fault injection, Fault's simulations, Hardware accelerators, High-low, High-throughput, Low latency, Neural network hardware, Reliability assessments, State of the art
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:mdh:diva-66660DOI: 10.1109/DDECS60919.2024.10508925ISI: 001227439800023Scopus ID: 2-s2.0-85192792789ISBN: 9798350359343 (print)OAI: oai:DiVA.org:mdh-66660DiVA, id: diva2:1859639
Conference
Proceedings - 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2024
2024-05-222024-05-222024-07-17Bibliographically approved