https://www.mdu.se/

mdu.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Test Generation and Mutation Analysis of Energy Consumption using UPPAAL SMC and MATS
Mälardalen University.
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0003-2416-4205
2023 (English)In: 2023 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS, ICSTW, IEEE COMPUTER SOC , 2023, p. 186-189Conference paper, Published paper (Refereed)
Abstract [en]

Testing is an essential process for ensuring the quality of the software. Designing software with as few errors as possible in most embedded systems is often critical. Resource usage is a significant concern for proper behaviour because of the very nature of embedded systems. To design energy-efficient systems, approaches are needed to catch desirable consumption points and correct them before deployment. Model-based testing can reduce testing effort, one testing method that allows for automatic test generation. However, this technique has yet to be studied extensively for revealing resource usage anomalies in embedded systems development. UPPAAL SMC is a statistical model-checking tool that can model the system's resource usage. This paper shows the tooling needed to achieve this and experimental results on automated test generation and selection using mutation analysis in UPPAAL SMC and how this is applied to a Brake by Wire industrial system. The evaluation shows that this approach, which we call MATS, is applicable and efficient for energy-based test generation.

Place, publisher, year, edition, pages
IEEE COMPUTER SOC , 2023. p. 186-189
Series
IEEE International Conference on Software Testing Verification and Validation Workshops, ISSN 2159-4848
Keywords [en]
Terms energy consumption, mutation analysis, test generation, UPPAAL SMC
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-63952DOI: 10.1109/ICSTW58534.2023.00042ISI: 001009223100028Scopus ID: 2-s2.0-85163139570ISBN: 979-8-3503-3335-0 (print)OAI: oai:DiVA.org:mdh-63952DiVA, id: diva2:1788245
Conference
16th IEEE International Conference on Software Testing, Verification and Validation (ICST), APR 16-20, 2023, Dublin, IRELAND
Available from: 2023-08-16 Created: 2023-08-16 Last updated: 2024-01-23Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Enoiu, Eduard Paul

Search in DiVA

By author/editor
Larsson, JonatanEnoiu, Eduard Paul
By organisation
Mälardalen UniversityEmbedded Systems
Computer Systems

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 58 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf