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Analysis of key comparisons with two reference standards: Extended random effects meta-analysis
Mälardalen University, School of Education, Culture and Communication, Educational Sciences and Mathematics. Phys Tech Bundesanstalt, Berlin, Germany.. (MAM)
Phys Tech Bundesanstalt, Berlin, Germany..
2019 (English)In: ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING XI / [ed] Forbes, AB Zhang, NF Chunovkina, A Eichstadt, S Pavese, F, WORLD SCIENTIFIC PUBL CO PTE LTD , 2019, p. 1-8Conference paper, Published paper (Refereed)
Abstract [en]

We propose a statistical method for analyzing key comparisons with two transfer standards measured in two petals. The new approach is based on an extension of the established random effects model. A full Bayesian analysis based on the reference prior is developed and analytic expressions for the results are derived. One benefit of the suggested approach is that it provides a comprehensive assessment of the laboratory biases in terms of their posterior distributions. Another advantage is that it can easily be applied in practice. The approach is illustrated for the CCM.M-K7 key comparison data.

Place, publisher, year, edition, pages
WORLD SCIENTIFIC PUBL CO PTE LTD , 2019. p. 1-8
Series
Series on Advances in Mathematics for Applied Sciences, ISSN 1793-0901 ; 89
Keywords [en]
extended random effects model, two transfer standards, reference analysis, CCM.M-K7
National Category
Mathematics
Identifiers
URN: urn:nbn:se:mdh:diva-51478ISI: 000569370000001ISBN: 9789813274303 (print)OAI: oai:DiVA.org:mdh-51478DiVA, id: diva2:1474650
Conference
11th Advanced Mathematical and Computational Tools in Metrology and Testing Conference, AUG, 2017, Univ Strathclyde, Glasgow, SCOTLAND
Available from: 2020-10-09 Created: 2020-10-09 Last updated: 2020-11-02Bibliographically approved

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Bodnar, Olha

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