Testing is one of the most important aspects in the development of new products. There are different types of testing a product can undergo, either hardware durability tests or software tests. Embedded systems are closely related to hardware and a key feature of them is the reliability and dependability. In order to assure that these features will remain intact no matter where the embedded systems operate it is very important to conduct standardized testing and give validation. The purpose of this thesis is to research the temperature testing procedure and develop a measurement guideline based on several key moments. The guideline is closely related to the standards and due to this reason some of the most frequently used standards are taken in consideration. The temperature measurement technology involves different tools or equipment. One interesting technology used for this purpose is the infrared technology through the investigation provided by the IR cameras. It is benefcial to integrate this technology in the contact measurements because it describes the temperature variation by colors, information which is very important in the first steps of the test procedure.