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Turn-off failure mechanisms in GTO thyristors of different anode designs supported by 3-D simulations
Scanner Lab, Department of Technology, Uppsala University, Uppsala, Sweden.
Scanner Lab, Department of Technology, Uppsala University, Uppsala, Sweden; Mälardalen Univ. College, Västerås, Sweden .
Scanner Lab, Department of Technology, Uppsala University, Uppsala, Sweden.
Scanner Lab, Department of Technology, Uppsala University, Uppsala, Sweden.
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1994 (English)In: Device Research Conference - Conference Digest, DRC, Institute of Electrical and Electronics Engineers Inc. , 1994, p. 33-34Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 1994. p. 33-34
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:mdh:diva-43073DOI: 10.1109/DRC.1994.1009404Scopus ID: 2-s2.0-85063592120OAI: oai:DiVA.org:mdh-43073DiVA, id: diva2:1314619
Conference
52nd Annual Device Research Conference, DRC 1994, 20 June 1994 through 22 June 1994
Available from: 2019-05-09 Created: 2019-05-09 Last updated: 2019-06-25Bibliographically approved

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CiteExportLink to record
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