mdh.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Cutting Time-to-Market by Adopting Automated Regression Testing in a Simulated Environment
Bombardier Transportat, Vasteras, Sweden..
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0003-0416-1787
MAXIMATECC, Vasteras, Sweden..
2014 (English)In: TESTING SOFTWARE AND SYSTEMS (ICTSS 2014) / [ed] Merayo, MG DeOca, EM, SPRINGER-VERLAG BERLIN , 2014, p. 129-144Conference paper, Published paper (Refereed)
Abstract [en]

Industrial system development is facing an ever growing complexity of the target applications together with market demands of reducing time and costs of products. This issue is even more relevant in safety critical domains, where the quality of the system has to be necessarily validated before any release can be placed on the market. Bombardier Transportation works in one of such domains, namely rail-equipment development, and has to deal with problems related to testing the developed applications in an efficient and effective way while trying to reduce costs and time-to-market. This work illustrates the concrete solutions adopted by the company in order to effectively test their systems; in particular, they adopt automated regression testing and simulated environments to speed-up the process and alleviate the problems due to hardware costs and size as well as the non-reversibility of reality.

Place, publisher, year, edition, pages
SPRINGER-VERLAG BERLIN , 2014. p. 129-144
Series
Lecture Notes in Computer Science, ISSN 0302-9743 ; 8763
Keywords [en]
Industrial System Testing, Automated Regression Testing, Simulation Environments, Rail Equipment Development
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:mdh:diva-38405ISI: 000378212600009ISBN: 978-3-662-44857-1 OAI: oai:DiVA.org:mdh-38405DiVA, id: diva2:1181655
Conference
26th IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS), SEP 23-25, 2014, Madrid, SPAIN
Available from: 2018-02-09 Created: 2018-02-09 Last updated: 2018-02-09Bibliographically approved

Open Access in DiVA

No full text in DiVA

Authority records BETA

Cicchetti, Antonio

Search in DiVA

By author/editor
Cicchetti, Antonio
By organisation
Embedded Systems
Computer and Information Sciences

Search outside of DiVA

GoogleGoogle Scholar

isbn
urn-nbn

Altmetric score

isbn
urn-nbn
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf