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Automated System Level Regression Test Prioritization in a Nutshell
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0003-0611-2655
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0002-1660-199X
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(English)In: IEEE Software, ISSN 0740-7459, E-ISSN 1937-4194Article in journal (Refereed) Accepted
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Computer Systems
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URN: urn:nbn:se:mdh:diva-35494OAI: oai:DiVA.org:mdh-35494DiVA: diva2:1104169
Projects
ITS ESS-H Industrial Graduate School in Reliable Embedded Sensor SystemsTESTMINE - Mining Test Evolution for Improved Software Regression Test Selection (KKS)
Available from: 2017-05-31 Created: 2017-05-31 Last updated: 2017-05-31Bibliographically approved

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Afzal, WasifWeyuker, ElaineDaniel, Sundmark
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