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Targeted Mutation: Efficient Mutation Analysis for Testing Non-Functional Properties
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0001-5297-6548
University of Skövde, Sweden.
SICS Swedish ICT Västerås AB, Sweden .
SICS Swedish ICT Västerås AB, Sweden .
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2017 (English)In: Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017, Institute of Electrical and Electronics Engineers Inc. , 2017, 65-68 p.Conference paper (Refereed)
Abstract [en]

Mutation analysis has proven to be a strong technique for software testing. Unfortunately, it is also computationally expensive and researchers have therefore proposed several different approaches to reduce the effort. None of these reduction techniques however, focuses on non-functional properties. Given that our goal is to create a strong test suite for testing a certain non-functional property, which mutants should be used? In this paper, we introduce the concept of targeted mutation, which focuses mutation effort to those parts of the code where a change can make a difference with respect to the targeted non-functional property. We show how targeted mutation can be applied to derive efficient test suites for estimating the Worst-Case Execution Time (WCET). We use program slicing to direct the mutations to the parts of the code that are likely to have the strongest influence on execution time. Finally, we outline an experimental procedure for how to evaluate the technique. 

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2017. 65-68 p.
Keyword [en]
Execution time, Mutation testing, Non-functional properties, Program slicing, Program processors, Verification, Experimental procedure, Mutation analysis, Non functional properties, Reduction techniques, Worst-case execution time, Software testing
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-35338DOI: 10.1109/ICSTW.2017.18ScopusID: 2-s2.0-85018402349ISBN: 9781509066766 OAI: oai:DiVA.org:mdh-35338DiVA: diva2:1096880
Conference
10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017, 13 March 2017 through 17 March 2017
Available from: 2017-05-19 Created: 2017-05-19 Last updated: 2017-05-19Bibliographically approved

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf