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Concurrency defect localization in embedded systems using static code analysis: An evaluation
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. ABB, Västeras, Sweden.
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0002-1364-8127
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems.ORCID iD: 0000-0001-6132-7945
2019 (English)In: Proceedings - 2019 IEEE 30th International Symposium on Software Reliability Engineering Workshops, ISSREW 2019, Institute of Electrical and Electronics Engineers Inc. , 2019, p. 7-12Conference paper, Published paper (Refereed)
Abstract [en]

Defects with low manifestation probability, such as concurrency defects, are difficult to find during testing. When such a defect manifests into an error, the low likelihood can make it time-consuming to reproduce the error and find the root cause. Static Code Analysis (SCA) tools have been used in the industry for decades, mostly for compliance checking towards guidelines such as MISRA. Today, these tools are capable of sophisticated data and execution flow analysis. Our work, presented in this paper, evaluates the feasibility of using SCA tools for concurrency defect detection and localization. Earlier research has categorized concurrency defects. We use this categorization and develop an object-oriented C++ based test suite containing defects from each category. Secondly, we use known and real defects in existing products' source code. With these two approaches, we perform the evaluation, using tools from some of the largest commercial actors in the field. Based on our results, we provide a discussion about how to use static code analysis tools for concurrency defect detection in complex embedded real-Time systems.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2019. p. 7-12
Keywords [en]
Concurrency, Defects, Real Time, RTOS, SCA, Static Code Analysis, C++ (programming language), Codes (symbols), Compliance control, Embedded systems, Interactive computer systems, Object oriented programming, Real time systems, Software reliability, Technical presentations, Compliance checking, Defect localizations, Embedded real time systems, Static code analysis tools
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:mdh:diva-47390DOI: 10.1109/ISSREW.2019.00034Scopus ID: 2-s2.0-85080936338ISBN: 9781728151380 (print)OAI: oai:DiVA.org:mdh-47390DiVA, id: diva2:1415555
Conference
30th IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2019; Berlin; Germany; 28 October 2019 through 31 October 2019; Category numberCFP1979F-ART; Code 157721
Available from: 2020-03-19 Created: 2020-03-19 Last updated: 2020-03-19Bibliographically approved

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Johansson, BjarnePapadopoulos, AlessandroNolte, Thomas

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