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Analysis of Key Comparisons with Two Reference Standards: Extended Random Effects Meta-Analysis
Mälardalen University, School of Education, Culture and Communication, Educational Sciences and Mathematics. (MAM)
Physikalisch-Technische Bundesanstalt (PTB) – National Metrology Institute of Germany.
(English)In: Advanced Mathematical and Computational Tools in Metrology and Testing XI / [ed] Alistair B Forbes, Nien-Fan Zhang, Anna Chunovkina, Sascha Eichstädt, Singapore: World ScientificChapter in book (Refereed)
Abstract [en]

We propose a statistical method for analyzing key comparisons with two transfer standards measured in two petals. The new approach is based on an extension of the established random effects model. A full Bayesian analysis based on the reference prior is developed and analytic expressions for the results are derived. One benefit of the suggested approach is that it provides a comprehensive assessment of the laboratory biases in terms of their posterior distributions. Another advantage is that it can easily be applied in practice. The approach is illustrated for the CCM.M-K7 key comparison data.

Place, publisher, year, edition, pages
Singapore: World Scientific.
Keywords [en]
extended random effects model, two transfer standards, reference analysis, CCM.M-K7
National Category
Probability Theory and Statistics Other Physics Topics
Research subject
Mathematics/Applied Mathematics
Identifiers
URN: urn:nbn:se:mdh:diva-41060ISBN: 9789813274297 (print)OAI: oai:DiVA.org:mdh-41060DiVA, id: diva2:1252002
Available from: 2018-09-28 Created: 2018-09-28 Last updated: 2018-10-01Bibliographically approved

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https://www.worldscientific.com/worldscibooks/10.1142/11100

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Bodnar, Olha

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