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2011 (English)In: SIES 2011 - 6th IEEE International Symposium on Industrial Embedded Systems, Conference Proceedings, 2011, p. 284-293Conference paper, Published paper (Refereed)
Abstract [en]
In this paper, we look at identifying temporal differences between different versions of Complex Real-Time Embedded Systems (CRTES) by using timing traces representing response times and executiontimes of tasks. In particular, we are interested in being able to reason about whether a particular change to CRTES will impact on their temporal performance, which is difficult to answer due to the complicatedtiming behavior such CRTES have. To be specific, we first propose a sampling mechanism to eliminate dependencies existing in tasks' response time and execution time data in the traces taken from CRTES, which makes any statistical inference in probability theory and statistics realistic. Next, we use a mature statistical method, i.e., the non-parametric two-sample Kolmogorov-Smirnov test, to assess the possible temporal differences between different versions of CRTES by using timing traces. Moreover, we introduce a method of reducing the number of samples used in the analysis, while keeping the accuracy ofanalysis results. This is not trivial, as collecting a large amount of samples in terms of executing real systems is often costly. Our evaluation using simulation models describing an industrial robotic controlsystem with complicated tasks' timing behavior, indicates that the proposed method can successfully identify temporal differences between different versions of CRTES, if there is any. Furthermore, our proposed method outperforms the other statistical methods, e.g., bootstrap and permutation tests, that are often widely used in contexts, in terms of bearing on the accuracy of results when other methods have failed.
National Category
Engineering and Technology
Identifiers
urn:nbn:se:mdh:diva-23813 (URN)10.1109/SIES.2011.5953672 (DOI)2-s2.0-80052009194 (Scopus ID)9781612848204 (ISBN)
Conference
6th IEEE International Symposium on Industrial Embedded Systems, SIES 2011; Västerås; Sweden; 15 June 2011 through 17 June 2011
2013-12-272013-12-192014-02-13Bibliographically approved